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JEOL 6700F Scanning Electron Microscope

Instrument types
SEM
Make / Model : 

JEOL 6700F SEM

 

MICROSCOPE FEATURES:

  • Cold cathode Field emission gun
  • 1.0 nm resolution at 15 KV
  • 2.2 nm resolution at 1 KV
  • Backscatter Electron detector (compositional and topographical imaging)
  • EDX detector