JEOL 8600 Electron Microprobe
FEATURES:
- Secondary and back-scattered electron imaging (~20 nm resolution)
- Compositional analysis (by Energy dispersive and wavelengthdispersive spectroscopies)
- Compositional mapping (by Energy dispersive and wavelengthdispersive spectroscopies)
![](http://prod.mrfn.org/sites/prod.mrfn.org/files/styles/medium/public/instrument/jeol-8600-electron-microprobe.jpg)