Bruker Dimension Icon® Atomic Force Microscope is equipped with ScanAsyst® automatic image optimization mode based on PeakForce Tapping technology, which enables users to obtain consistent high-quality results more easier and faster. This system is capable of many SPM applications (contact mode AFM, tapping mode AFM, ScanAsyst peakforce tapping mode, AFM in fluid, Phase imaging, piezoresponse, MFM, KPFM, and many others.) The following unique new capabilities will broaden our current SPM applications:
- Material Mapping
- Electrical Characterization
- Nanomanipulation
- Heating and Cooling
- Imaging Modes and Capabilities
MRFN.org is supported by the MRSEC Program of the National Science Foundation. Image in the header is courtesy of CRISP MRSEC.