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Scanning Probe Microscopy

Instrument

AFM-Bruker Dimension Icon; contact mode, tapping mode, peakforce tapping, PFQNM, MFM, PRM, EFM, PFKPFM, and SCM @ Materials Characterization Lab @ Center for Nanoscale Science
AFM-Dimension 3100; contact mode, tapping mode, and phase imaging @ Materials Characterization Lab @ Center for Nanoscale Science
Agilent 5500 environmental SPM plus high-speed force-curve mapping and multifrequency methods @ Characterization Facility (CharFac) @ UMN Materials Research Science and Engineering Center
Agilent 5500 environmental SPM plus inverted light microscope @ Characterization Facility (CharFac) @ UMN Materials Research Science and Engineering Center
Asylum MFP-3D Bio System w/ Olympus IX71 Inverted Microscope @ Microscopy and Microanalysis Facility @ Materials Research Laboratory: an NSF MRSEC
Asylum MFP-3D Standard System w/Low Force Indenter @ Microscopy and Microanalysis Facility @ Materials Research Laboratory: an NSF MRSEC
Auxiliary Equipment @ The Soft Materials Characterization Laboratory (SMCL) at the University of Wisconsin-Madison @ Materials Research Science and Engineering Center on Structured Interfaces
Bruker Dimension ICON Atomic Force Microscope @ Surface & Materials Characterization @ UNL Materials Research Science and Engineering Center
Bruker Dimension ICON3 AFM @ Imaging and Analysis Center @ Princeton Center for Complex Materials
Bruker Multimode 8 Atomic Force Microscope (AFM, SPM) @ The Nanoscale Imaging and Analysis Center (NIAC) at the University of Wisconsin-Madison @ Materials Research Science and Engineering Center on Structured Interfaces
Bruker Nanoscope V Multimode 8 with QNM @ Characterization Facility (CharFac) @ UMN Materials Research Science and Engineering Center
CreaTec LT-HV nc-AFM/STM @ Imaging and Analysis Center @ Princeton Center for Complex Materials
DI Dimension 3000
DI EnviroScope Atomic Force Microscope @ Surface & Materials Characterization @ UNL Materials Research Science and Engineering Center
DI Nanoscope IIIa Dimension 3100 SPM system @ Surface & Materials Characterization @ UNL Materials Research Science and Engineering Center
Digital Instruments Multiprobe
Digital Instruments Scanning Probe Microscope @ Shared Materials Instrumentation Facility (SMIF) @ Research Triangle MRSEC
Hysitron Ubi-1 Nanoidenter @ Analytical Instrumentation Facility (AIF) @ Research Triangle MRSEC
Nanoindentation-Hysitron TriboIndenter TI 900; <1nN Load Resolution, Load or Displacement Controlled Measurments @ Materials Characterization Lab @ Center for Nanoscale Science
Raman / AFM System @ Center for Biomanufacturing Research Institute & Technology Enterprise (BRITE) @ Research Triangle MRSEC
Scanning probe microscopy @ Materials Research Laboratory Central Research Facilities @ Illinois MRSEC
Topometrix Discoverer STM and AFM @ Surface Characterization Facilities @ Materials Research Science Engineering Center
Veeco Dimension 3000/3100 Scanning Probe Microscope @ Microscopy and Microanalysis Facility @ Materials Research Laboratory: an NSF MRSEC
Veeco Multi-Mode NanoScope I & II @ Microscopy and Microanalysis Facility @ Materials Research Laboratory: an NSF MRSEC

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