- Material Mapping
- Electrical Characterization
Shared facilities operated by the Nebraska Center for Materials and Nanoscience (NCMN). The Surface and Materials Characterization Facility (SMCF) provides state-of-the-art instruments for nanometer-scale surface measurement, thermal analysis, and mechanical characterization of a variety of materials.
The Digital Instruments EnviroScope Atomic Force Microscope (ESCOPE) combines AFM imaging with environmental controls and hermetically sealed sample chamber to perform contact, lateral force, and TappingMode atomic force microscopy in air, vacuum, or a purged gas, as well as a heating environment. With advanced environmental capabilities, users can observe sample reactions to a variety of complex environmental conditions while scanning.
The Digital Instruments Nanoscope IIIa Dimension 3100 SPM system provides high resolution 3D images for characterization of a large variety of materials, such as nanoparticles, polymers, DNA, semiconductor thin films, magnetic media, optics and other advanced nanostructures. SPM can provide a wealth of information from topography, surface morphology, to magnetic phase or friction analysis, including line width, grain size, thin film thickness, roughness measurements, sectioning of surfaces, particle analysis, surface defects, and pattern recognition, etc.
- Differential Scanning Calorimeter (DSC 204 F1 Phoenix)
- Thermogravimetry Analysis System (TGA 209 F1 Libra)
Both systems operate through a large temperature range -175°C to 700°C for the DSC and 25°C to 1100°C for the TGA. These systems allow users to study and measure various thermal properties of materials such as; glass-transition temperatures, melting temperatures, melting enthalpy, crystallization temperatures, crystallization enthalpy, transition enthalpies, phase transformations, phase diagrams and other thermal properties.