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DI Nanoscope IIIa Dimension 3100 SPM system

Instrument types

The Digital Instruments Nanoscope IIIa Dimension 3100 SPM system provides high resolution 3D images for characterization of a large variety of materials, such as nanoparticles, polymers, DNA, semiconductor thin films, magnetic media, optics and other advanced nanostructures. SPM can provide a wealth of information from topography, surface morphology, to magnetic phase or friction analysis, including line width, grain size, thin film thickness, roughness measurements, sectioning of surfaces, particle analysis, surface defects, and pattern recognition, etc.