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Program Application

Bruker Dimension AFM

Instrument types

This is a highly automated, multimode system for high resolution scanning of large samples. Scan areas up to 40 um are typical with in-plane resolution of 2-10 nm and height resolution < 1 nm. Topography imaging is typically performed in tapping mode using Bruker's ScanAsyst technology. Numerous advanced modes are also available. Electrical characterization can be performed in Kelvin probe and conductive modes; phase contrast and other nanomechanical measurements are also possible. FastScan mode, which measures topography with a 5-10x improvement in speed, is also available.