FEI XL40
The FEI XL40 SEM is also equipped with a thermal field emission electron source. This SEM has both standard and in-lens detectors for high-resolution microscopy. Because of its relatively light schedule, this instrument is ideal for fast turn-around work, and because samples are introduced directly into the chamber (without a load lock) the FEI SEM is the best choice for oddly shaped samples and specialty holders.