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Program Application

JEOL 8600 Electron Microprobe

Instrument types

Electron Microscopy

Make / Model :

JEOL 8600 EMP

FEATURES:

Secondary and back-scattered electron imaging (~20 nm resolution)
Compositional analysis (by Energy dispersive and wavelengthdispersive spectroscopies)
Compositional mapping (by Energy dispersive and wavelengthdispersive spectroscopies)