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Johns Hopkins University
Materials Research Science Engineering Center
Surface Characterization Facilities
More details on Facility's page
Access:
External academic, Government, Industry, International
Surface Characterization Facilities
Instruments
AFM/MFM
Molecular Image Picoscan AFM
STM Tip Etching and Coating
Tencor Thin Film Profilometer
Topometrix Discoverer STM and AFM
X-Ray Photoelectron Spectrometer
Features:
Compositional analysis
Oxidation states of ionic solids
Analysis area from 600 nm to 1mm diameter
Composition depth profiles
News
Shared instrumentation facilities: Benefiting researchers and universities, and sustaining research excellence
Making the Best of a Bad Situation: A Characterization Seminar Series
How NSF's Materials Research Facilities Network helps bolster the field of materials science and engineering
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MRFN.org is supported by the MRSEC Program of the National Science Foundation. Image in the header is courtesy of CRISP MRSEC.