Skip to:
Skip to content
Skip to navigation
MRFN Member Login
Username
*
Password
*
Request new password
Program Application
Materials Research Facilities Network
Search form
Search
MRFN
Centers
Facilities
Instruments
Instrument types
People
Training Materials
About MRFN
Tools on MRFN.org
MRFN Workshops
NSF MRSEC Facilities Satellite & MRFN Workshop 2018
MRFN Workshop 2018
MRFN Workshop 2011
Other DMR Sites
MRSEC
PREM
You are here
Home
Johns Hopkins University
Materials Research Science Engineering Center
Surface Characterization Facilities
Instrument Technical Primary Contact:
Peter Searson
More details about this Instrument
X-Ray Photoelectron Spectrometer
Make / Model :
PHI 5400 XPS
Features:
Compositional analysis
Oxidation states of ionic solids
Analysis area from 600 nm to 1mm diameter
Composition depth profiles
News
Shared instrumentation facilities: Benefiting researchers and universities, and sustaining research excellence
Making the Best of a Bad Situation: A Characterization Seminar Series
How NSF's Materials Research Facilities Network helps bolster the field of materials science and engineering
Read Other News
MRFN.org is supported by the MRSEC Program of the National Science Foundation. Image in the header is courtesy of CRISP MRSEC.