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Cornell University
Cornell Center for Materials Research
Mick Thomas
Electron Microscopy Facility Manager
Expertise in instruments:
FEI Strata 400 STEM FIB
Fischione 1010 Ion mill
Thermo Fisher Spectra 300 30-300kV Kraken & Andromeda STEMs
Tescan Mira3 FESEM
Thermo Fisher Helios G4 UX Focused Ion Beam
Zeiss Gemini 500 SEM
Zeiss Sigma 500 SEM
Expertise in Instrument Types:
Focused Ion Beam
Electron Microscopy
Transmission Electron Microscopy
STEM
SEM
Image Analysis and Processing
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MRFN.org is supported by the MRSEC Program of the National Science Foundation. Image in the header is courtesy of CRISP MRSEC.