The Icon AFM incorporates the latest evolution of Bruker’s industry-leading nanoscale imaging and characterization technologies on a large sample tip-scanning AFM platform. The Icon’s temperature-compensating position sensors render noise levels in the sub-angstroms range for the Z-axis, and angstroms in X-Y.
The Icon AFM in the NIAC allows has Peak Force Tapping, the Quantitative Nanomechanical Analysis software and the Fast Tapping as available options.
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