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Program Application

Atomic Content Characterization

Instrument

AES-Physical Electronics 670; 50nm spatial resolution; in situ fracture stage @ Materials Characterization Lab @ Center for Nanoscale Science
Bruker Multimode 8 Atomic Force Microscope (AFM, SPM) @ The Nanoscale Imaging and Analysis Center (NIAC) at the University of Wisconsin-Madison @ Wisconsin MRSEC
ESEM-FEI Quanta 200 Environmental SEM; 10nm Resolution, BSE, EDS, and Temperature Control @ Materials Characterization Lab @ Center for Nanoscale Science
FESEM-FEI NanoSEM 630; 1.7nm Resolution, BSE, EDS, Beam Deceleration @ Materials Characterization Lab @ Center for Nanoscale Science
STEM-FEI Titan 3 G2; 0.7A Resolution, EDS, EELS, and EFTEM @ Materials Characterization Lab @ Center for Nanoscale Science
STEM-JEOL 2010F; 2.0A Resolution, EDS, and EELS @ Materials Characterization Lab @ Center for Nanoscale Science
TEM-JEOL 2010; 2.3A Resolution, EDS, EELS and EFTEM @ Materials Characterization Lab @ Center for Nanoscale Science
TEM-Phillips 420; 3.4A Resolution with EDS @ Materials Characterization Lab @ Center for Nanoscale Science
Thermogravimetric Analyzer Mass Spectrometer @ TEMPO Facility @ Materials Research Laboratory: an NSF MRSEC
XPS-Kratos Analytical Axiz Ultra @ Materials Characterization Lab @ Center for Nanoscale Science

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