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Tescan S8252G Raman - SEM/FIB

Instrument types

The TESCAN S8252G is an Ultra-High Resolution Variable Pressure Schottky field emission scanning electron microscope/Ga+ focused ion beam instrument for imaging and sample milling and W, Fe, and Co deposition (GIS) capabilities. It is equipped with WITec in-situ confocal Raman imaging at 532 nm and 785 nm excitation wavelengths using a 100x objective, NA = 0.75.  The SEM/FIB has an Everhart-Thornley detector, two retractable backscatter detectors (one water-cooled), an in-beam multi-detector, in-beam axial detector, and secondary ion detector.  The instrument is also capable of 3-D imaging using any of the detectors.

Nanoscale compositional analysis may be performed with an EDAX Octane Elect Plus (30mm2) energy dispersive X-ray spectroscopy (EDS) system with APEX software.

In-situ manipulation for TEM foil extraction is performed using a SmarAct nano-manipulator, with 1 nm positioning resolution and an electron flood gun for charge neutralization during ion beam milling

The Gatan Murano heating stage allows for in-situ analysis from room temperature to 950 C.

This instrument was acquired through the support of the National Science Foundation (DMR-1828454)