FEI FG-200
This FEI STEM instrument is configured with a CEOS probe-side aberration corrector, which provides revolutionary performance in STEM imaging and microanalysis. Imaging single atoms, and nanoscale Chemical and Structure analysis. With <0.08 nm spatial resolution Zcontrast STEM imaging, <0.1 nm spatial resolution HRTEM imaging. It is fully equipped for analytical analysis with EDS and electron energy loss spectrometers.
MRFN.org is supported by the MRSEC Program of the National Science Foundation. Image in the header is courtesy of CRISP MRSEC.
