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Scanning Probe Microscopy
Facility
Characterization Facility (CharFac)
Imaging and Analysis Center
Imaging and Characterization Facility
Materials Analysis SEF
Materials Characterization Lab
Materials Cluster
Materials Preparation and Measurement Laboratory (MPML)
Materials Research Laboratory Central Research Facilities
Microscopy and Microanalysis Facility
Multifunctional Scanning Probe/Confocal-Raman
NanoSystems Laboratory (NSL)
Scanning Electron Microscopy/Scanning Tunneling Microscopy/Atomic Force Microscopy Facility (UHV-SEM/STM/AFM)
Surface & Materials Characterization
The Nanoscale Imaging and Analysis Center (NIAC) at the University of Wisconsin-Madison
The Soft Materials Characterization Laboratory (SMCL) at the University of Wisconsin-Madison
UD Keck Center for Advanced Microscopy and Microanalysis
Variable Temperature UHV Scanning Tunneling Microscope
News
Shared instrumentation facilities: Benefiting researchers and universities, and sustaining research excellence
Making the Best of a Bad Situation: A Characterization Seminar Series
How NSF's Materials Research Facilities Network helps bolster the field of materials science and engineering
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