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Home
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Microscopy (372)
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Scanning Probe Microscopy (73)
Scanning Tunneling Microscopy
Instrument
Bruker Standalone STM with Nanoscope IIIa Controller
@
Materials Preparation and Measurement Laboratory (MPML)
@
Chicago Materials Research Center
Scanning probe microscopy
@
Materials Research Laboratory Central Research Facilities
@
Illinois MRSEC
STM Tip Etching and Coating
@
Surface Characterization Facilities
@
Materials Research Science Engineering Center
People
Jerry Hunter
@
Wisconsin MRSEC
Justin Jureller
@
Chicago Materials Research Center
News
Shared instrumentation facilities: Benefiting researchers and universities, and sustaining research excellence
Making the Best of a Bad Situation: A Characterization Seminar Series
How NSF's Materials Research Facilities Network helps bolster the field of materials science and engineering
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MRFN.org is supported by the MRSEC Program of the National Science Foundation. Image in the header is courtesy of CRISP MRSEC.