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Profilometry
Instrument
Bruker Multimode 8 Atomic Force Microscope (AFM, SPM)
@
The Nanoscale Imaging and Analysis Center (NIAC) at the University of Wisconsin-Madison
@
Materials Research Science and Engineering Center on Structured Interfaces
Dektak Profilometer
@
Central Facility for Microelectronics
@
Center for Advanced Materials Research
Filmetrics Optical Profilometer
@
Nanostructures Laboratory
@
UMass Amherst Materials Research Science and Engineering Center
Keyence VK-X260 Laser-Scanning Confocal Microscope
@
Materials Cluster
@
Cornell Center for Materials Research
KLA Tencor Alphastep 200 profilometer
@
Imaging and Characterization Facility
@
CRISP: Center for Research on Interface Structures and Phenomena
Optical Profilometer-ZYGO NewView 7300; Surface Topography, Coating Thickness, Step Height, and 3D Imaging
@
Materials Characterization Lab
@
Center for Nanoscale Science
Profilometer
@
Shared Materials Instrumentation Facility (SMIF)
@
Research Triangle MRSEC
Surface Analysis
@
Materials Research Laboratory Central Research Facilities
@
Illinois MRSEC
Surface Profilometer (3 units)
@
The Nanoscale Fabrication Center (NFC)
@
Materials Research Science and Engineering Center on Structured Interfaces
Tencor Alpha step 500
@
Materials Cluster
@
Cornell Center for Materials Research
Tencor Thin Film Profilometer
@
Surface Characterization Facilities
@
Materials Research Science Engineering Center
Veeco Dektak Stylus Profilometer
@
Nanostructures Laboratory
@
UMass Amherst Materials Research Science and Engineering Center
ZYGO 9000 Optical Profilometer
@
The Nanoscale Imaging and Analysis Center (NIAC) at the University of Wisconsin-Madison
@
Materials Research Science and Engineering Center on Structured Interfaces
People
Jerry Hunter
@
Materials Research Science and Engineering Center on Structured Interfaces
News
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