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University of Chicago
Chicago Materials Research Center
Justin Jureller
Facility Manager
Expertise in Instrument Types:
Electrical Characterization
PPMS
Microscopy
SEM
Image Analysis and Processing
Optical Microscopy
Confocal Fluorescence Microscopy
Scanning Probe Microscopy
Atomic Force Microscopy
Scanning Tunneling Microscopy
Optical Spectrometry
Dynamic Light Scattering
Thermal Characterization
Calorimetry
Thermo-Gravimetric Analysis
Spectroscopy
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MRFN.org is supported by the MRSEC Program of the National Science Foundation. Image in the header is courtesy of CRISP MRSEC.